Used Vickers Instruments Vickers Instruments Binocular Microscope for sale (1,548)

Year of construction: 2019, condition: good (used), LEICA DMi1 Leica HI PLAN I 20x/0.30 PH1 objective lens Dsdpjzhib Rsfx Anzswa Leica HI PLAN I 10x/0.22 PH1 objective lens Leica HI PLAN 4x/0.10 objective lens Leica S40 slider, ref. 11526113 Leica S40/0.45 condenser Leica HC PLAN S 10x/20 eyepiece(s) Leica MC120 HD camera Digital screen for live viewing and image analysis.

Year of construction: 2017, condition: used, Specifications Optics: infinity-corrected optical system, RMS-threaded objectives with 45mm parfocal distance Objectives: LPlan PH2 10X/0.25 - LPlan PH2 4x/0.13 - LPlan PH2 20x/0.40 Illumination: adjustable intensity LED (>50,000-hour lifespan per light cube) Contrast methods: transmitted light (brightfield and phase contrast) Objective turret: 4-position, manual control Condenser: 3-position turret for brightfield and phase contrast Dwodpfxszh Rd Hj Anzsa Condenser working distance: 60mm Stage: fixed stage Focus mechanism: coaxial focus knobs with tension control Coarse focus: 38mm/revolution Fine focus: 0.2mm/revolution, precision 0.002mm LCD display: 12.1 in. high-resolution (1024 x 768 pixels) color monitor with adjustable tilt Camera: Color, 1/2 in. 2048 x 1536 pixels, 3.1 megapixels Image acquisition: embedded operating system with software for image capture and saving via mouse or front-mounted manual buttons Captured images: color camera; 24-bit full color; TIFF, PNG, jpeg, bmp; 2048 x 1536 pixels Output ports: Two USB 2.0 ports Power supply: AC adapter; input 100-240V, 47-63 Hz; output 12 VDC/2.0A 24W max Dimensions: 40.6 x 31.8 x 53.3cm (6 x 12.5 x 21 in.) Weight: 9.1kg (20.1 lb.)

Condition: good (used), Olympus CKX53SF inverted microscope, suitable for cell culture, live cell observation, and general laboratory use. This configuration is equipped with integrated phase contrast (iPC) and comes with multiple objectives and various accessories. Configuration: UPLFLN4xIPC/0.13 objective CACHN10x IPC/0.25 objective LCACHN20xIPC/0.40 objective LCACHN40xIPC/0.55 objective 10X/22 eyepiece CKX3-SLP pre-centered phase contrast slider Various accessories, including coverslip platforms, sliders, and additional accessories. Features: Inverted microscope, ideal for cell culture applications. Dedpezhidfofx Anzowa iPC phase contrast for fast and high-contrast observation. Professional Olympus platform, compact and well-suited for laboratory environments.

Year of construction: 2020, condition: good (used), Well-maintained Leica DM IL LED Cellfactory inverted microscope, suitable for cell culture, phase contrast, and routine live-cell observation. Dwsdpfjzhia Hex Anzja Configuration: HI PLAN 4x/0.10 PH0 objective HI PLAN I 20x/0.30 PH1 objective HI PLAN I 20x/0.30 PH1 objective HI PLAN I 40x/0.50 PH2 objective S40/0.45 Leica condenser (521251) HC C-mount 0.50x Slider HC Plan 10x/20 eyepiece(s) Flexacam C1 with remote control Various accessories A robust setup for laboratories, biotechnology, research, and cell culture applications.

Condition: defective spare-parts repository (used), Vickers Type: HVS 1000 The digital micro-Vickers hardness tester HVS 1000 features a unique and precise design in the areas of mechanics, optics, and light source, and is capable of producing a clearer image of the impression, thus enabling more accurate measurements. Main purpose and scope of application: 1. Iron and steel, non-ferrous metals, metal foils, hard alloys, sheet metal, microstructures 2. Carburized, nitrided, and decarburized layers, surface hardening layers, plating, coatings 3. Glass, wafers, ceramic materials Specifications: Model HVS1000 Type Digital Micro Hardness Tester Test forces (N) 0.098 / 0.246 / 0.49 / 0.98 / 1.96 / 2.94 / 4.90 / 9.80 Test forces (Kgf) 10 / 25 / 50 / 100 / 200 / 300 / 500 / 1000 Load control Automatic loading and unloading Objective-indenter turret Manual Dwell time (s) 0~60 Microscope magnification x 400x for measurement, objective 40x, eyepiece 10x 100x for observation, objective 10x, eyepiece 10x Micrometer resolution (μm) 0.01 Test range 5 HV~3000 HV Dimensions of XY test table 100X100 mm Travel range of XY test table 25X25 mm Dodpfxjzgbr So Anzjwa Max. sample height 120mm Max. sample width 110mm Hardness conversion HK, HRA, HRB, HRC, HRD, HR15N, HR30N, HR45N, R15T, HR30T, HR45T, HV, HBW Output Built-in printer, RS232 interface Power 220V, 60/50Hz Dimensions (mm) 441 x 270 x 480 Net weight / kg) 35 Condition: used Scope of delivery: (See picture) (Subject to changes and errors in technical data and information!) We will be happy to answer any further questions you may have by phone.

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom Dwedezd Ufaopfx Anzja – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), TAMAR Type: FEMET_WI_ID071_TAMAR PLMIS Optical Microscope Optical Microscope The TAMAR optical microscope ID071 is used for the optical inspection of samples with a maximum size of approximately 780x650mm2 (substrate size) in the PLG cleanroom. Substrate size: complete substrate size (780x650mm2) Objective: The objective lens focuses the light emanating from the object being observed to create a real image for the viewer. Brightfield mode (BF): Light from the microscope is directed through the objective lens onto the sample. High resolution, low contrast Darkfield mode (DF): Illumination mode for increasing contrast, high contrast for edges and particles. Principle: The center of the incident light beam is blocked, and only peripheral light is directed through the objective lens and strikes the sample from the side. This causes edges and particles to appear bright, while the smooth background appears dark. TAMAR Optical Microscope ID071 X-Y Stage Software Revision 1.0 Condition: used Dwedpfx Aozd Sqmjnzoa Scope of supply: (autosampler as shown in the picture) (Changes and errors in the technical data are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: excellent (used), Shimadzu Type: Prestige-21 / with AIM-8800 Infrared Microscope Shimadzu IR Prestige-21 Infrared Spectrophotometer The IRPrestige-21 is designed for both highly sensitive and broad applications in the fields of research and development. It is an excellent addition to the existing FTIR series, which covers, among other things, the standard laboratory area. AIM-8800 Specifications Optics: 15x Cassegrain objective lens 15x Cassegrain condenser mirror with inlet for purging MCT detector: with liquid nitrogen monitoring system Wavelength range: Type 1 - 5000 - 720 cm-1 Type 2 - 5000 - 650 cm-1 Electrically activated aperture XY Θ directional drive. Adjustment of the XY directional increments is 1 µm above the sample surface and 1° steps in the Θ direction (numerical input possible). Minimum adjustment value: 3µm Motor-driven XY sample stage Positioning range: X-axis: 70 mm; Y-axis: 30 mm Resolution: 1 µm spacing Sample thickness: Reflection mode - ≤ 40 mm Transmission mode - ≤ 10 mm Operation via the main unit's keyboard Selection of the measurement mode / XY stage operation (speed control in 4 steps) / manual focusing / illumination control (Optional) Control via PC Selection of the measurement mode / XY stage operation / automatic centering / manual focusing / automatic focusing / illumination control / Aperture adjustment / aperture preview / measurement position and recording of the aperture setting (10 sample positions, 2 background positions) Environmental conditions: Ambient temperature: 15°C ~ 30°C Humidity: 70% or less External dimensions, weight: W410mm x D540 mm x H520 mm x 36kg Dwodjzdyyijpfx Anzja Condition: used Scope of supply: (See image) (Changes and errors in the technical data and information are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is a device equipped with an integrated 4 MB image memory, a 40 MB hard drive for internal image storage, as well as drives for external storage of data and images. This allows for quick and easy acquisition of information about the composition and morphology of specimen surfaces, even down to the sub-micrometer range. With a magnification range of 5x to 300,000x, both the examination of macrostructures and microstructures is possible. Through special attachments, the range of applications can be significantly expanded, enabling, for example, analytical investigations in micro-areas of the surface. The device can be operated using conventional switches or via the keyboard and mouse (optional). The electron optics and vacuum control are conventional. The functions of the image memory are operated using the keyboard or mouse (optional). A separate information display is located centrally on the control panel for displaying the menus. This user manual is intended to serve as a guide for the user to achieve the best possible results with the device. The explanations have been kept as simple as possible in order to provide even a less experienced user with the necessary knowledge. Magnification range: 20x to 300,000x at a 7 mm working distance Steps in a sequence of 1-2-3-5-10 Minimum magnification: 5x at a 50 mm working distance Resolution: 4 nm - guaranteed with tungsten filament at 30 kV, 6 mm working distance, untilted specimen 25 nm - guaranteed with tungsten filament at 1 kV, 6 mm working distance, untilted specimen 3.5 nm - guaranteed with optimized LaB6 filament at 30 kV, 6 mm working distance, untilted specimen Dwsdezdthyspfx Anzoa Scope of supply: (DSM 962 with accessories as shown) Condition: used (Changes and errors in the technical data are subject to change!) Please inquire about transport options before purchasing. We will be happy to answer any further questions you may have by phone.

Condition: good (used), Here, we offer a handling device from ZASCHESitec. This device was used in the manufacturing of instrument panels. It consists of the following components: KBK - FPM 10 - 7.0 x 5.0 Traveling carriage - LWK 762 x 762 Lifting module - Z-L6 - 80/1280 - 1486 Djdpfxozdim He Anzjwa Load handling device - GP10 Load capacity: 10 kg Scope of delivery: (ZASCHESitec handling device, technical documentation) Condition: used We would be happy to answer any further questions you may have over the phone. Written orders can be placed via email or fax.

Year of construction: 2014, condition: new, digital length measuring device, manufacturer: Heidenhain, ID 355 533-04 Dwodpsb T Uqijfx Anzea Measuring scale, type LF 481 – Signal 1Vss – Measuring length 200mm.

Condition: used, Tool measuring device Dwodpfx Aeddtuyjnzja Manufacturer: Mitutoyo Type: Quickset R

Condition: excellent (used), Microscope Magnifying glass Manufacturer: Hartmann Type: Accu Lux 20x magnification in a wooden box Dwsdpod Iacwefx Anzsa with operating instructions

Year of construction: 2005, condition: used, functionality: unexamined, machine/vehicle number: X-1802, Used Andor Ixon DV885JCS-VP microscope camera in a case. Manufacturer: Andor Technology Model: (Ixon) DV885JCS-VP Dsdpfx Anjzgtnfozjwa Includes software, power supply, connection cables, and system PCBs.

Condition: used, functionality: unexamined, machine/vehicle number: SX-50, Used Cameca SX-50 Electron Microprobe Cameca SX-50 electron microprobe is used (Electron Probe MicroAlalyses). it has a 6” inch stage, 3 WDX Spectrometers with several Cristals LiF, PET, TAP, ODPb, PC1, PC2, PC3. Dwsdswnb D Tepfx Anzea Electron probe microanalysis (EPMA) are generally considered micro-analytical techniques which are able to image or analyze materials we can not generally observe with the resolution offered by visible techniques System is complete with all Books, service Manuals, Software and computer. Also many parts. 1 x Leybold Trivac D16B Vacuum Pump 1 x Alcatel 2012 A Vacuum Pump 2 x integrated Turbo Pumps

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04078-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Djdpjx Eugiefx Anzjwa

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 04078-T, used, in good condition, 100% functional, scope of delivery as shown in photos. Dwjdpfex Eug Ajx Anzsa

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser transmission line sensor 29/16 03819-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Dsdpfx Aox Eugcsnzewa

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04079-R, used, in good condition, fully functional, scope of delivery as per photos. Dsdjx Eugpjpfx Anzewa

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 47/16 04077-T, used, in good condition, 100% functional, delivery as per photos. Dodox Eugvjpfx Anzjwa

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL Laser Through-Beam Line Sensor 47/16 04079-T, used, in good condition, 100% fully functional, delivery as per photos. Dsdpfx Aex Eug Njnzewa

Year of construction: 2024, condition: as good as new (ex-display), functionality: fully functional, The JCM-7000 combines simple sample navigation with a range of advanced automatic functions. A large sample chamber, high resolution, and an optional low vacuum mode for non-conductive samples make this desktop SEM a versatile, mobile all-rounder. Features: Dedpfx Anjzn Ih Ajzewa • SE/BSE detection • Magnification up to x100,000, resolution approx. 8 nm • Low vacuum operation for non-conductive samples • Hardware and software integrated EDX system for elemental characterization • Live elemental analysis, live imaging (including 3D imaging/topography) • Intuitive operation with recipes, automatic functions, image montages, etc. • Large chamber for samples up to 80 mm diameter and 50 mm height • Compact & mobile • Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H

Year of construction: 2022, condition: as good as new (ex-display), functionality: fully functional, Description (detailed specifications): o 5-axis stage o Modern, expandable user interface with EDX integration and image montage o SE detector o Scintillator-BSE detector (retractable) o In-lens detector o Low-vacuum system with BSE detector (retractable) Dwsdpezn Ihpefx Anzja o Fully software-integrated JEOL EDX system (60mm²) o In-column current measurement o Navigation camera o Live camera o Control panel o Desk, PC with Windows OS, 2 x 24" monitor, keyboard

Condition: refurbished (used), Year of construction: 2025, operating hours: 12 h, functionality: fully functional, measuring range X-axis: 400 mm, measuring range Y-axis: 200 mm, measuring range Z-axis: 200 mm, workpiece weight (max.): 15 kg, warranty duration: 12 months, total height: 2,000 mm, type of input current: AC, total width: 1,000 mm, total length: 800 mm, overall weight: 800 kg, input voltage: 230 V, Equipment: documentation/manual, lighting, type plate available, Mahr Multiscope 400 Multisensor Measuring Device equipped with camera and Renishaw touch probe system Fully functional with factory acceptance before delivery! Comprehensive maintenance history Measuring range: 400x200x200 mm Maximum workpiece weight (glass plate): 15 kg Instrument weight: 800 kg Control cabinet weight: 90 kg External dimensions: 800x1000x2000 mm Maximum traverse speed: 150 mm/s Accuracy: U1=1.9 + L/200; U2=2.4 + L/150; U3=2.9 + L/100 (L = measurement length in mm) Factory-refurbished premium multisensor measuring center with warranty and guarantee, rebuilt 2025. Includes the latest software update for Windows 10 (Windows 11 upgrade and OptiCheck3D 2025 available as options), including free lifetime software hotline and user support. Dsdpfxow Slafe Anzjwa Optional: Delivery via factory service or forwarding agent, worldwide. Optional: On-site commissioning & calibration Optional: Training service Online and on-site demos available with customer parts, application consulting by accredited Profitech metrology laboratories during project planning. Available complete service: – Delivery, installation, commissioning, acceptance according to standards, certification, and comprehensive acceptance documentation. Individual training and education programs also bookable as online courses. Creation of your measuring programs for direct operation with the device is also possible. Rental, lease-purchase, or financing possible directly via Profitech without any financial institution. The measuring device can be individually configured to customer requirements (within the EU). Reference number: 01814-1-ms400 (Please always include this with inquiries)

Condition: used, 2 Carl Zeiss microscopes with accessories Dwjdpfxjurlprs Anzja