Used Surface Measuring Device Roughness / Contour for sale (22,286)

Condition: ready for operation (used), Year of construction: 2009, Mahr MarSurf CD 120 Contour and Roughness Measuring Instrument, Surface Measuring Instrument Measuring range: 120mm Measuring force adjustable from 2 mN to 120 mN Mahr ST 500 measuring stand Year of manufacture: 2009 Accessories: Bjdpfx Aszmtlqsm Tjlk Contour measuring probe: Mahr PCV probe arm 350 Roughness measuring probe (software license for roughness measurement has expired) Mahr calibration standard Mahr cross slide table You are welcome to come and inspect the equipment. We would be happy to arrange cost-effective shipping for you! You will receive a proper invoice. For foreign customers, a net invoice can also be issued, provided a valid VAT identification number is available. Subject to prior sale. Visit our shop and see our other offers. The company names and trademarks mentioned are the property of their respective owners and are used solely for identification and description of the products. Deviations from technical data and errors in the description of the item may occur and are subject to change.

Condition: ready for operation (used), Year of construction: 2012, Mahr MarSurf LD 260 Aspheric Measurement Station, Roughness Tester, Contour Measurement Device Measurement range X: 0.1 to 260 mm Measurement speed: 0.02 to 10 mm/s Contour accuracy: ± (1.0 + L/150) µm Stylus system measurement range: 13 mm (100 mm stylus arm) / 26 mm (200 mm stylus arm) Measuring force: 0.5 to 30 mN Year of manufacture: 2012 Contour and roughness measurements - Suitable for spherical and aspherical components You are welcome to visit us for an inspection. We would be happy to arrange cost-effective shipping for you! You will receive a proper invoice. For foreign customers, a net invoice can also be issued. A valid VAT identification number is required. Bjdpfxszntr Hs Am Tslk Subject to prior sale. Visit our shop and view our other offers. The company names and trademarks mentioned are the property of their respective owners and are used solely for identification and description of the products. Deviations from technical data as well as errors in the description of the article may occur and are subject to change.

Condition: used, Optacom VC-10 Universal Measuring System Surface Roughness Tester / Contour Measuring Device Bsdpfx Asybbd Ssm Tslk Device is sold without PC and software (hardware only). Resolution in X and Z axes: 0.002 µm Resolution at the probe tip: 0.003 µm VC-10 measuring range horizontal/vertical (X-axis/Z-axis): 225 mm Measuring system: optical, incremental, and non-contact in all axes (X, Z, T) Accuracy: +/- (0.5 + L/100) µm Maximum measuring force: 10 - 150 mN Measuring speed: 0.1 – 2 mm/sec (automatically optimized) Probe tip radius: 0.002 – 1 mm Measurable slopes: 78° upwards; 87° downwards VC-10 dimensions (W x D x H): 950 x 380 x 725 mm VC-10 weight (approx.): 150 kg Description has been adopted as provided. You are welcome to arrange an on-site inspection. Upon request, we can organize affordable shipping for you! You will receive a proper invoice. For international customers, a net invoice can be issued provided a valid VAT ID number is supplied. Subject to prior sale. Visit our shop and check out our other offers as well. The company names and trademarks mentioned are the property of their respective owners and are used only for identification and description of the products. Deviations from technical data and errors in the description of the item may occur and are subject to change.

Condition: excellent (used), Mitutoyo contour&roughness measuring machine Formtracer CS 3000 H4 in very good condition measuring ranges: Z = 5mm (stage 350mm) X = 100mm Machine was completely overhauled und got a used PC (new installed) and nearly new software Formtracepak 5.3 Overhauled measuring table (50x100mm) and self centering vice for € 2.000,-- on demand. Included are a lot of measuring tip (new price appx. € 3.000,--) Optionally we offer installation, calibration and softwaretraining Price is for delivery inside european union Bljdpfx Amop Ecg Ro Tek

Condition: refurbished (used), functionality: fully functional, measuring range X-axis: 100 mm, measuring range Z-axis: 40 mm, travel distance Z-axis: 350 mm, Mitutoyo contou measuring machine Contracer CBH400 in very good condition measuring ranges: Z = 40mm X = 100mm Stage = 350mm Machine was completely overhauled und got a used PC with Windows 7 (new installed) and software Mitutoyo Formpakpak (new Formtracepak as an option) Overhauled measuring table (50x100mm) and self centering vice for € 2.000,-- on demand. Bsdpfoum Etmex Am Telk Optionally we offer installation, calibration and softwaretraining Price is for delivery inside european union

Condition: good (used), Contour measuring device, contour measuring device, contourograph, contourograph, roughness measuring device, roughness measurement, roundness measurement, roughness probe -Manufacturer: Hommel, measuring probe for roughness measuring device -Measuring probe: Type P2FE 30 / P2F E 100 -Individual components: see photos Bodpfxjk Hdr Ts Am Tjlk -Box dimensions: 235/105/H30 mm -Weight: 0.4 kg

Year of construction: 1999, condition: excellent (used), Control: CNC-controlled and can also be operated manually PC P 2000 MMX-PCI Desktop ATX Color screen 15“, keyboard CNC-Turbo Roughness for WINDOWS TECHNICAL DATA Hard rock test plate (DIN 876) Length x Width: 1200 x 500 mm Accuracy grade: Grade 2 Flatness: 16.6 µm Weight: 250 kg Linear feed unit Waveline 60 Basic Probe stroke: 60 mm Resolution: 0.014 µm Bodpjlxyp Hsfx Am Tolk Measuring column Wavelift 400 CNC Travel: 400 mm Positional repeatability: < 10 µm Device dimensions W x D x H: 1.8 x 0.8 x 2.2 m Weight: 600 kg EQUIPMENT/ACCESSORIES  Complete enclosure with electrically operated roller shutters  Hard rock plate 1200 x 500 mm  ISEL feed axis with ball screw  Workpiece clamping plate  Linear feed unit Waveline 20/60  Measuring column Wavelift 400 CNC  Tilting unit KEG 60 on the measuring column, manually adjustable to the Waveline  Installation kit for roughness measurement  Installation kit for contour measurement  Various probes and holders for roughness and contour measurements  Device table  EMERGENCY stop button on the device table  Calibration set  Support prisms  Maintenance unit for compressed air preparation  Air damping elements for supporting the hard rock plate  Documentation

Condition: ready for operation (used), Mahr MarSurf M 400 SD26 Roughness measuring device Measuring device Evaluation unit Bljdpfovclcwex Am Tok Brand: MAHR Model: MarSurf M 400 Touch probe: Free touch probe Measuring range roughness: +/- 250 µm, +/- 750 µm Scanning distance min.: 1.75 mm Scanning distance max.: 17.5 mm Cut-off wavelength: 0.25 mm, 0.8 mm, 2.5 mm Measuring profile memory (number of individual values): 40000 STK Measuring profile memory (number of profiles): 30 ST New price: 11.190 € net Calibration standard is not included in the scope of delivery - Bluetooth connection between the feed unit and the display unit. - Measure in all directions horizontally, vertically and overhead. You are welcome to visit us for an inspection. We will be happy to arrange a cost-effective forwarding agent for you. organize! You will receive a proper invoice. A net invoice can also be issued for foreign customers. Prerequisite is a valid VAT number. Subject to prior sale. Visit our store and have a look at our other offers. Company names and trademarks are the property of their owners and are used only to identify and describe the products. Deviations from technical data and errors in the description of the article may occur and are reserved

Condition: excellent (used), functionality: fully functional, measuring range X-axis: 12 mm, Mitutoyo roughness measuring machine Surftst SJ301 in good condition incl. CEJ stand, but without carrying case and roughness standard (option) measuring ranges: Bljdexluiuepfx Am Tsk Z = 0,3mm (optional stage 550mm) X = 12.5mm Optional: Rougness standard new € 390,-- optional stylus from € 800,-- (different types) Vice (used) € 100,-- some prisms on demand Mitutoyo Stage 178-039 upgrade € 450,--

Condition: good (used), Mahr Perthen Perthometer S4P roughness tester 1 x Mahr Perthen Perthometer S4P roughness tester Bledpfx Aoihfmujm Tek 1 x Mahr Perthen 6 86 20 63 1 x Mahr Perthen 42 50 01 50 up to 160 mm Ø Find more roughness gauges in other sizes- new and used

Condition: as good as new (ex-display), Year of construction: 2024, operating hours: 15 h, Precise Profile Measuring Instrument | Excellent Condition | Ready for Immediate Use For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit provides accurate measurements with extended travel ranges and features a stable granite base for reliable results. — Condition • Pre-owned, technically inspected • Fully operational • Very well maintained — Technical Highlights – Chotest SJ-5760P Travel Ranges • X-axis: 0–200 mm • Z-axis: 0–450 mm • Device dimensions: 800 × 450 × 1100 mm • Weight: 220 kg — Profile Measurement (SJ-5760P) • Measuring range Z1: ±25 mm • Resolution: 0.001 µm • Measurement direction: Top / Down • Measuring speed: 0.05–5 mm/s • Positioning speed: X/Z up to 20 mm/s • Measuring force: 10–150 mN, adjustable • Guideway deviation: ≤1 µm / 200 mm Accuracy • X-axis indication error: ±(0.5 + 0.015L) µm • Z1-axis indication error: ±(0.5 + 0.05H) µm • Distance: ±(0.8 + 0.02L) µm • Radius: ≤(1 + R/15) µm • Angle: ≤±45’’ — Key Features Bodox Db Stepfx Am Tslk • Ideal for precise contour and profile measurements • Extremely high vertical resolution (0.001 µm) • Very stable granite base for low-vibration operation • Large travel ranges for diverse component geometries • User-friendly and reliable measuring technology • Suitable for micron-accurate form measurement in both laboratory and production environments

Condition: ready for operation (used), MarSurf M300 MarSurf RD 18 Mahr roughness measuring device with evaluation unit Bledpfsvcly Nex Am Tek The device can only be operated with a cable. Battery operation without function. Bluetooth Measuring principle: stylus method Probe: inductive skid probe Unit of measurement: selectable Measuring range: 350 µm Profile resolution: 8 nm Characteristic values: Ra, Rq, Rz (Ry (JIS) corresponds to Rz), Rz (JIS), Rmax, Rp, RpA (ASME), Rpm (ASME), Rpk, Rk, Rvk, Mr1, Mr2, A1, A2, Vo, Rt, R3z, RPc, Rmr (tp (JIS, ASME) corresponds to Rmr), RSm, RSk, RS, CR, CF, CL, R, Ar, Rx, Rv Vertical scale automatic/selectable Horizontal scale dependent on cut-off Total distance In according to ISO/JIS: 1.25 mm / 4.0 mm / 12.5 mm Number n of individual measuring sections acc. to ISO/JIS: selectable 1-5 Scanning speed 0.5 mm/s Probe tip: 2 µm Measuring force: approx. 0.7 mN You are welcome to visit us for an inspection. We will be happy to arrange a cost-effective forwarding agent for you. organize You will receive a proper invoice. A net invoice can also be issued for foreign customers. Prerequisite is a valid VAT number. Subject to prior sale. Visit our store and have a look at our other offers. Company names and trademarks are the property of their owners and are used only to identify and describe the products. Deviations from technical data and errors in the description of the article may occur and are reserved.

Condition: ready for operation (used), Hommel Tester T1000 Surface Roughness Tester Measuring Device Bsdpfexxad Rex Am Tjlk Measuring range: ± 80 µm Resolution: 0.01 µm, ± 320 µm Resolution: 0.04 µm You are welcome to come by for an inspection. We can also arrange affordable shipping for you! You will receive a proper invoice. For foreign customers, a net invoice can also be issued. The prerequisite is a valid VAT identification number. Subject to prior sale. Visit our shop and also take a look at our other offers. The company names and trademarks mentioned are the property of their respective owners and are used solely for identification and description of the products. Deviations from technical data and errors in the item description may occur and are subject to change.

Condition: excellent (used), functionality: fully functional, measuring range X-axis: 100 mm, measuring range Z-axis: 1 mm, travel distance Z-axis: 550 mm, Mitutoyo roughness measuring machine Surftst SV 3100 H4 in very good condition measuring ranges: Z = 0,8mm (stage 550mm) X = 100mm Machine was completely overhauled und got a used PC (new installed) and nearly new software Formtracepak 4.0 machine will be equiped with a very new roughness sensor (4mN) Overhauled measuring table (50x100mm) and self centering vice for € 2.500,-- on demand. Optionally we offer installation, calibration and softwaretraining Blodjrdg H Uopfx Am Tok Price is for delivery inside european union

Condition: reconditioned (used), Mahr Rougness Measuring system M2 - measuring range 12,5mm - skid probing 300µm - computing device with TFT display - Printer - Adjustable rack with turntable Bodpfxsvki Sls Am Tolk

Condition: excellent (used), functionality: fully functional, measuring range X-axis: 25 mm, measuring range Z-axis: 1 mm, Well-maintained Mitutoyo surface roughness tester Surftest, model SV402. Measuring ranges: Z = 0.8mm, X = 50mm. Includes: Mitutoyo measuring stand with mounting plate, roughness reference standard, standard measuring probe 4mN, 90°, built-in printer. Bsdpfx Asx N Ukpom Tjlk Optional: Various measuring probes from €250, used vise €100. Price includes delivery within the EU.

Condition: reconditioned (used), functionality: fully functional, measuring range X-axis: 12 mm, Mitutoyo roughness measuring machine Surftst SJ201 in good condition with carrying case and roughness standard measuring ranges: Z = 0,3mm (optional stage 550mm) X = 12.5mm Optional: optional stylus from € 800,-- (different types) Vice (used) € 100,-- Mitutoyo Height gage as stage € 200,-- Blodpfxex N Szrs Am Tjk CEJ stage with granite base € 250,-- Mitutoyo Stage 178-039 upgrade € 450,-- some prisms on demand

Condition: like new (used), functionality: fully functional, measuring range X-axis: 12 mm, Mitutoyo roughness measuring device Surftst SJ211 in very good condition with carrying case and roughness standard measuring ranges: Z = 0,3mm X = 12.5mm Optional: optional stylus from € 800,-- (different types) Vice (used) € 100,-- Mitutoyo Height gage as stage € 200,-- CEJ stage with granite base € 250,-- Mitutoyo Stage 178-039 upgrade € 450,-- Bljdpfx Asx N S Aijm Tek some prisms on demand

Condition: good (used), Wenzel roughness and contour measuring station for crankshafts  Measuring plate made of hard stone length: 3670 mm width: 850 mm Flatness tolerance according to DIN 876/1 Nominal value 48 µm Bljdpoihillofx Am Tek Actual value 32 µm Ident No.: 14280 JFA unwinding trestles Financing through our bank is also possible. komplett-konzept.leasingo.de Further measuring plates in other sizes - new and used - can be found in our shop! International shipping costs on request!

Condition: excellent (used), Load measuring device, overload protection -Manufacturer: Demag, Load measuring device, overload protection, original packaging -Type: MGS 0.63/2.20 -Item No.: 49169244 -Individual components: see photos -Cardboard dimensions: 285/220/60 mm Blsdpfx Aszlxb Ijm Tsk -Weight: 1.1 kg

Condition: ready for operation (used), Year of construction: 2024, Mahr MarSurf XP 20 Professional CNC surface and contour measuring station – manufactured in 2024 Technical data Bedezqzn Uopfx Am Tjlk Manufacturer: Mahr Model: MarSurf XP 20 Professional – Series 1000 Year of manufacture: 2024 Condition: Used Equipment MarSurf XP 20 Professional with LD control MarWin Professional Contour & Roughness Plus CNC-Plus software QS-STAT Plus (Q-DAS interface) Industrial PC (Dell) with Windows 10 IoT Enterprise Feed unit MarSurf LD 130 Feed length: 130 mm Standard measuring stroke Z: 13 mm Stylus arm changing unit for up to 10 stylus arms 4-axis CNC workpiece positioning system Tilting axis ±135° Rotary axis ±170° Linear axis X: 400 mm Linear axis Y: 400 mm Positioning accuracy: approx. ±250 µm (X/Y/Z) Hard stone measuring plate with mechanical-pneumatic vibration isolation CNC measuring column 17" touchscreen Control cabinet Sound-insulated protective enclosure Machine dimensions Enclosure (W × D × H): 1450 × 1300 × 2270 mm Accessories Adapter plate X/Y/Z offset Manual chuck DM28 Signal column Stylus arm set Additional stylus arm 32 GB RAM Complete technical documentation (digital and in paper form) Description For sale is a high-quality CNC surface and contour measuring station from Mahr. This system is suitable for highly precise measurement tasks in industrial quality control and features comprehensive equipment with professional measurement and evaluation software as well as an automatic 4-axis positioning system. The system was manufactured in 2024 and is in used condition. Inspection possible by arrangement. We will gladly provide further information, photos or documents upon request.

Condition: excellent (used), Load measuring device, overload protection -Manufacturer: Demag, Load measuring device, overload protection, original packaging -Type: MGS 1.25/2.75 -Item No.: 49189444 -Individual components: see photos -Cardboard dimensions: 290/220/60 mm -Weight: 1.1 kg Bsdpezk Daaefx Am Tjlk

Condition: excellent (used), Fries Research & Technology Device Designation: FRT MicroProf® MPR 1250 The FRT MicroProf® MPR 1250 is a high-precision surface metrology system from the MicroProf® series by Fries Research & Technology GmbH (FRT). These systems are designed for non-destructive and contactless analysis of surface parameters such as topography, roughness, layer thickness, and more. Features of the FRT MicroProf: Device Details: Model: FRT MicroProf® MPR 1250 Item Number: 200 00 Sensor Type: CWL 300 µm Serial Number: 0904001 Measurement Principle: Chromatic confocal point sensor Light Source: Halogen lamp, white light Vertical resolution: up to 3 nm Measurement accuracy (Z): 100 nm Lateral resolution (XY): 2.5 µm Measurement angle to surface: 90° ±30° Max. sample size: approx. 310 x 310 x 50 mm Technical Data (Excerpt): XY-Stage: Type: Compact XY-cross table Travel (measurement range): 200 x 200 mm Guidance: mechanical cross roller guide Drive: DC motor with ball screw Position feedback system: Heidenhain glass scale with reference mark System resolution: 0.2 µm Repeatability: < ±1 µm Orthogonality XY: < 4 µm / 200 mm Blsdpfszii Rusx Am Tsk Vertical runout (per axis): < 2 µm / 200 mm Z-Axis (motorized): Type: Linear axis Travel: 50 mm (optional 100 mm) Drive: Stepper motor with spindle drive Lateral runout: < 2 µm / 50 mm Manual Coarse Adjustment (optional): Type: Dovetail guide Adjustment range: up to 300 mm sample height Measurement: Minimum point spacing (XY): 0.6 µm Sample size: approx. 310 x 310 x 50 mm Max. sample weight: 5 kg (optional 10 kg) Measuring speed: 1 µm/s up to max. 100 mm/s System: Total weight: approx. 275 kg (measurement setup: 225 kg) Footprint (measurement setup): approx. 0.9 x 0.8 m Dimensions control unit (W x D x H): approx. 0.55 x 0.53 x 0.32 m Power supply (EU/US): 110–240 V, 50–60 Hz, 16 A Power consumption: approx. 300–400 W Operating Conditions: Temperature range: 22 °C ±5 °C Temperature stability: < 0.5 °C Weight approx. 500 kg Condition: The device is in very good technical and cosmetic condition. All axes move precisely and smoothly. Scope of Delivery: MicroProf® MPR200 00 XY measuring system Control unit Connection cables (Subject to technical modifications and errors. All information without obligation!) Inspection and onsite testing available by appointment. For further questions, feel free to contact us by phone.

Condition: excellent (used), Mitutoyo Model: QV-L404Z1L-D Item Description: For sale is a CNC vision measuring machine from the renowned manufacturer MITUTOYO. This is the Quick Vision Active 404 model. The device is ideal for precise optical measurements in production, quality assurance, and research. Technical Data: Brand / Type: Mitutoyo QV-L404Z1L-D (Quick Vision Active 404) Measuring range (X / Y / Z): 400 × 400 × 200 mm Camera: CMOS color camera Software: Mitutoyo QVPAK QVPAK (R) Version: 13.301.0075 Optics: Zoom lens, LED illumination system Worktable: High-precision glass stage Equipment: Control PC with QVPAK measuring software 2 × 22" TFT monitors Keyboard & mouse Control panel Swivel office chair for comfortable operation Scope of delivery: Mitutoyo Quick Vision Active 404 measuring device Control PC with QVPAK 2× TFT monitors (22") Keyboard, mouse Control panel Swivel office chair Condition: used Scope of delivery: (see image) Bledpfx Amszii Duo Tjk (Specifications and technical data are subject to change and errors reserved!) Further questions can gladly be answered by phone.

Condition: good (used), Measuring device for µA -30 m² to 750 m² -approx. 1000 ohms to 5000 ohms -Dimensions: 200/90/H265 mm Blsdpob A N R Rofx Am Tjk -Weight: 3 kg