X-ray diffractometer (XRD)
PANalytical X’Pert PRO MPD

Name: PANalytical X’Pert PRO MPD
Brand: PANalytical
Price: 13500 EUR
Availability: InStock

Fixed price plus VAT

€13,500

Condition

Used

Location

Borken

$X-ray diffractometer (XRD) PANalytical X’Pert PRO MPD$

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Machine data

Machine type:: X-ray diffractometer (XRD)

Manufacturer:: PANalytical

Model:: X’Pert PRO MPD

Condition:: used

Price & Location

Fixed price plus VAT

€13,500

Location:: Einsteinstraße 8a, 46325 Borken, Deutschland

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Details about the offer

Listing ID:: A19531791

Reference number:: 24688

Update:: 10.07.2025

Description

PANalytical
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)

Excerpt from the service report:
Device: PANalytical X’Pert PRO MPD
Report date: 07.07.2021
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of goniometer and additional components
- Maintenance carried out, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT
FILTER, WATER
Motor PW3050
("Device was not tested in-house")

The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials. It is ideal for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for both routine analyses and complex in-situ experiments.

Key features:
- Multiple measurement geometries possible:
- Reflection measurements in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
- Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
- Modular system with PreFIX technology:
- Rapid change of optics and sample stages without recalibration
- In-situ measurements at high temperatures:
- Measurements up to approx. 1200°C possible
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing atmospheres)

Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In-situ investigation of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles and pore structures
- Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more

Technical data (typical)
Property & Specification
Angle range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: vertical, 0–0, radius approx. 240 mm
Temperature range: room temperature up to approx. 1200°C
Atmosphere: air, N₂, O₂ (limited for reducing atmospheres)
Detectors: X’Celerator (1D), proportional counter

Distribution & application areas:
The X’Pert PRO MPD is in use worldwide at, for example:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g., Max Planck Institutes, ICN2, IS2M)
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- Industry (e.g., materials development, pharmaceuticals, chemistry)

Condition: used
Scope of delivery: (See image)
(Specifications and technical data subject to change and error!)
For further questions, we are happy to assist you by phone.

The listing was translated automatically. Translation errors are possible.

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Registered since: 2012

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